UiO66–NH2 AS A NEW PHOTOCATALYST FOR THE DEGRADATION OF p–XYLENE IN GASEOUS PHASE

Loc L. C.

Abstract


Ammonia functionalized UiO66 (UiO66–NH2) in the form of thin film was synthesized by a solvothermal method combined with a dip–coating technique and determined with physicochemical characteristics by X–ray diffraction (XRD), scanning electron microscopy (SEM), nitrogen physisorption measurements (BET), infrared spectroscopy (IR), thermogravimetric analysis (TGA), and ultraviolet–visible diffuse reflectance spectroscopy (UV–Vis DRS). Also, the obtained material was assessed on the photoactivity in the degradation of p–xylene in the gas phase. Photoreaction was carried out in the micro flow reaction system with the radiation sources of a UV lamp (λ = 365 nm, the power of 8 W) and 81 pieces of light emitting diode (LED) (λ = 400–510 nm, total power of 19.2 W). The results showed that UiO66–NH2 was successfully prepared in the ball shape and featured by a high surface area of up to 576 m2/g, a band gap energy of 2.83 eV and a thermal stability of up to 673 K. Additionally, UiO66–NH2 thin film catalyst performed an efficiency of 1.27 g/gcat in the earlier 60 minutes of the photodegradation of p–xylene. The optimal treatment conditions were established with the moisture content of 8.65 mg/L and the atmospheric oxygen with the concentration of 300 mg/L.


Keywords


UiO66–NH2, photocatalyst, degradation, p–xylene, gas phase.

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DOI: https://doi.org/10.15625/2525-2518/55/1B/12089 Display counter: Abstract : 187 views. PDF : 84 views.

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Published by Vietnam Academy of Science and Technology